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- Title:
Defect studies in as-deposited and processed nanocrystalline Si/SiO2 structures
- Author(s):
- PROKES, SM; CARLOS, WE; VEPREK, S; al., et
- Journal title:
- PHYSICAL REVIEW B
- Year:
- 1998
- Journal volume:
- 58
- Journal issue:
- 23
- Pages contribution:
- 15632-15635
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