A THERMODYNAMIC CRITERION OF THE CRYSTALLINE-TO-AMORPHOUS TRANSITION IN SILICON
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES
1982
45
1
137-145
PROPERTIES OF MICROCRYSTALLINE SILICON - ELECTRICAL-CONDUCTIVITY, ELECTRON-SPIN RESONANCE AND THE EFFECT OF GAS-ADSORPTION
HELVETICA PHYSICA ACTA
1982
55
2
161-161
HIGHLIGHTS OF PREPARATIVE SOLID-STATE CHEMISTRY IN LOW-PRESSURE PLASMAS
PURE AND APPLIED CHEMISTRY
1982
54
6
1197-1220
EFFECT OF SUBSTRATE BIAS ON THE PROPERTIES OF MICROCRYSTALLINE SILICON FILMS DEPOSITED IN A GLOW-DISCHARGE
SOLID STATE COMMUNICATIONS
1982
42
6
465-468
RAMAN-SCATTERING FROM HYDROGENATED MICROCRYSTALLINE AND AMORPHOUS-SILICON
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS
1982
15
2
377-392
OPTICAL-ABSORPTION IN HYDROGENATED MICROCRYSTALLINE SILICON
HELVETICA PHYSICA ACTA
1982
55
5
565-565
STRUCTURAL AND SOME OTHER PROPERTIES OF SILICON DEPOSITED IN AN SICL4-H2 RF DISCHARGE
THIN SOLID FILMS
1982
87
1
43-51
BORON AND DOPED BORON 1ST WALL COATINGS BY PLASMA CVD
JOURNAL OF NUCLEAR MATERIALS
1982
103
1-3
257-260
EFFECT OF SURFACE CONTAMINATION AND PRETREATMENT ON THE HYDROGEN DIFFUSION INTO AND OUT OF TITANIUM UNDER PLASMA CONDITIONS
JOURNAL OF NUCLEAR MATERIALS
1982
103
1-3
465-469
DETERMINATION OF NONHOMOGENEOUS HIGH-CONCENTRATION DEPTH DISTRIBUTIONS USING ELASTIC BACKSCATTERING DATA
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
1982
28
1
25-33