- Author(s):
- PROKES, SM; CARLOS, WE; VEPREK, S; al., et
- Title:
- Defect studies in as-deposited and processed nanocrystalline Si/SiO2 structures
- Journal title:
- PHYSICAL REVIEW B
- Year:
- 1998
- Journal volume:
- 58
- Journal issue:
- 23
- Pages contribution:
- 15632-15635
- BibTeX