Knipper, U. ; Pfirsch, F. ; Raker, T. ; Niedermeyr, J. ; Wachutka, G..Destruction in the Active Part of an IGBT Chip Caused by Avalanche-Breakdown at the Edge Termination Structure,. pp.159-162.7th International Conference on Advanced Semiconductor Devices and Microsystems - ASDAM ´08.12.10.2008 - 16.10.2008, Smolenice Castle, Slovakia.2008