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- Title:
Understanding why the thinnest SiNx interface in transition-metal nitrides is stronger than the ideal bulk crystal
- Author(s):
- ZHANG, R. F.; ARGON, A. S.; VEPREK, S.
- Journal title:
- PHYSICAL REVIEW B
- Year:
- 2010
- Journal volume:
- 81
- Journal issue:
- 24
- Fulltext / DOI:
- doi:10.1103/PhysRevB.81.245418
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