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Document type:
Konferenzbeitrag 
Author(s):
Wachutka, G. 
Title:
Virtual Testing of High Power Devices at the Rim of the Safe Operating Area and Beyond 
Pages contribution:
6-11 
Book / Congress title:
Proceedings of the 26th International Symposium on PowerSemiconductor Devices & IC´s 
Congress (additional information):
ISPSD´14 - June 15-19, 2014 Waikoloa, Hawaii, USA 
Publisher:
IEEE 
Year:
2014 
Print-ISBN:
978-1-4799-2917-7 
Reviewed:
ja 
Language:
en