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Title:

Comparative Study of Contact Topographies of 4,5 kV SiC MPS Diodes for Optimizing the Forward Characteristics

Document type:
Konferenzbeitrag
Author(s):
Huang, Y.; Wachutka, G.
Pages contribution:
117-120
Book / Congress title:
Proceedings of Simulation of Semiconductor Processes and Devices
Year:
2016
Language:
en
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