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- Title:
Applicability of Raman scattering for the characterization of nanocrystalline silicon
- Author(s):
- OSSADNIK, C; VEPREK, S; GREGORA, I
- Journal title:
- THIN SOLID FILMS
- Year:
- 1999
- Journal volume:
- 337
- Journal issue:
- 1-2
- Pages contribution:
- 148-151
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