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Document type:
Zeitschriftenaufsatz 
Author(s):
Borthen, P.; Wachutka, G. 
Title:
"Testing semiconductor devices at extremly high operating temperatures" 
Journal title:
Microelectronics Reliability 
Year:
2008 
Journal volume:
Vol 28, issues 8-9, special issue ESREF 2008 
Pages contribution:
pp.1440-1443 
Reviewed:
ja 
Language:
en 
Publisher:
Elsevier 
Semester:
SS 02 
Format:
Text