User: Guest  Login
Less Searchfields
Simple search
Title:

"Testing semiconductor devices at extremly high operating temperatures"

Document type:
Zeitschriftenaufsatz
Author(s):
Borthen, P.; Wachutka, G.
Journal title:
Microelectronics Reliability
Year:
2008
Journal volume:
Vol 28, issues 8-9, special issue ESREF 2008
Pages contribution:
pp.1440-1443
Reviewed:
ja
Language:
en
Publisher:
Elsevier
Semester:
SS 02
Format:
Text
 BibTeX