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- Title:
"Testing semiconductor devices at extremly high operating temperatures"
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Borthen, P.; Wachutka, G.
- Journal title:
- Microelectronics Reliability
- Year:
- 2008
- Journal volume:
- Vol 28, issues 8-9, special issue ESREF 2008
- Pages contribution:
- pp.1440-1443
- Reviewed:
- ja
- Language:
- en
- Publisher:
- Elsevier
- Semester:
- SS 02
- Format:
- Text
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