"Testing semiconductor devices at extremly high operating temperatures"

Titel:: "Testing semiconductor devices at extremly high operating temperatures"
Dokumenttyp:: Konferenzbeitrag
Autor(en):: Borthen, P.; Wachutka, G.
Kongress- / Buchtitel:: Proceedings of the 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF -
Kongress / Zusatzinformationen:: Sept. 29 to Oct. 2, 2008, Maastricht, The Netherlands
Jahr:: 2008
Reviewed:: ja
Sprache:: en
Erscheinungsform:: CD-ROM / DVD
Semester:: SS 08
Format:: Text
BibTeX

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