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Title:

Influence of Quasi-3D Filament Geometry onf the Latch-Up Threshold of High-Voltage Trench-IGBTs

Document type:
Konferenzbeitrag
Contribution type:
Vortrag / Präsentation
Author(s):
Toechterle, C.; Pfirsch, F.; Sandow, C.; Wachutka, G.
Pages contribution:
177 - 180
Book / Congress title:
Proceedings of Simulation of Semiconductor Processes and Devices
Date of congress:
2016, Sep. 6 - 8
Year:
2016
Year / month:
2016-09
Month:
Sep
Print-ISBN:
978-1-5090-0818-6/16
Language:
en
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