High-throughput estimation of crop traits: A review of ground and aerial phenotyping platforms

Jin, X.; Zarco-Tejada, P.; Schmidhalter, U.; Reynolds, M.; Hawkesford, M.; Varshney, R.; Yang, T.; Nie, Ch.; Li, Z.; Ming, B.; Xiao, Y.; Xie, Y.; Li, S.

doi:10.1109/mgrs.2020.2998816

Title:: High-throughput estimation of crop traits: A review of ground and aerial phenotyping platforms
Document type:: Zeitschriftenaufsatz
Author(s):: Jin, X.; Zarco-Tejada, P.; Schmidhalter, U.; Reynolds, M.; Hawkesford, M.; Varshney, R.; Yang, T.; Nie, Ch.; Li, Z.; Ming, B.; Xiao, Y.; Xie, Y.; Li, S.
Journal title:: IEEE Geoscience and Remote Sensing Magazine
Year:: 2020
Pages contribution:: 0-0
Language:: en
Fulltext / DOI:: doi:10.1109/mgrs.2020.2998816
Publisher:: Institute of Electrical and Electronics Engineers (IEEE)
E-ISSN:: 2168-68312473-23972373-7468
Date of publication:: 01.01.2020
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