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Title:

Impact of the Activation of Carbon Vacancies at High Temperatures on the Minority Carrier Lifetimes in the Intrinsic Area of 4H-SiC PiN Rectifier

Document type:
Konferenzbeitrag
Contribution type:
Vortrag / Präsentation
Author(s):
Lechner B.; Huang Y.; Wachutka G.
Pages contribution:
9-12
Book / Congress title:
Proceedings of the 12th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)
Congress (additional information):
Smolencie, Slovakia
Date of congress:
21.10-24.10.2018
Year:
2018
Year / month:
2018-10
Month:
Oct
Pages:
9-12
Language:
en
TUM Institution:
Lehrstuhl für Technische Elektrophysik
Ingested:
20.11.2018
 BibTeX