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Document type:
Konferenzbeitrag
Contribution type:
Textbeitrag / Aufsatz
Author(s):
Tremmel, A.J.; Weiss, R.; Schardt, M.; Koch, A.W.
Title:
Inline hyperspectral thickness determination of thin films using neural networks
Book / Congress title:
Proc. SPIE 10213, Hyperspectral Imaging Sensors: Innovative Applications and Sensor Standards 2017, 102130G
Date of publication:
28.04.2017
Year:
2017
Quarter:
2. Quartal
Year / month:
2017-04
Month:
Apr
Reviewed:
ja
Language:
en
Publication format:
Print
Fulltext / DOI:
doi:10.1117/12.2262070
WWW:
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10213/1/Inline-hyperspectral-thickness-determination-of-thin-films-using-neural-networks/10.1117/12.2262070.short?SSO=1
Semester:
SS 17
TUM Institution:
Lehrstuhl für Messsystem- und Sensortechnik
Format:
Text
Ingested:
04.01.2018
Last change:
08.02.2018
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