Dong, X.; Zhang, Y.; Li, H.; Yan, Y.; Li, J.; Song, J.; Wang, K.; Jakobi, M.; Yetisen, A.K.; Koch, A.W..Microscopic Image Deblurring by a Generative Adversarial Network for 2D Nanomaterials: Implications for Wafer-Scale Semiconductor Characterization.ACS Applied Nano Materials.2022.5.Sep.12855−12864