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Title:

Virtual Testing of High Power Devices at the Rim of the Safe Operating Area and Beyond

Document type:
Konferenzbeitrag
Author(s):
Wachutka, G.
Pages contribution:
6-11
Book / Congress title:
Proceedings of the 26th International Symposium on PowerSemiconductor Devices & IC´s
Congress (additional information):
ISPSD´14 - June 15-19, 2014 Waikoloa, Hawaii, USA
Publisher:
IEEE
Year:
2014
Print-ISBN:
978-1-4799-2917-7
Reviewed:
ja
Language:
en
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