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Title:

Modeling Reliability Issues in RF MEMS Switches

Document type:
Konferenzbeitrag
Contribution type:
Vortrag / Präsentation
Author(s):
Schrag, G.; Künzig, T.; Wachutka, G.
Pages contribution:
pp 432-435
Editor:
IEEE
Book / Congress title:
Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices
Congress (additional information):
SISPAD 2013, September 3-5, Glasgow, Scotland, UK
Year:
2013
Language:
en
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