Deep-Learning-Based Microscopic Imagery Classification, Segmentation, and Detection for the Identification of 2D Semiconductors.

Titel:: Deep-Learning-Based Microscopic Imagery Classification, Segmentation, and Detection for the Identification of 2D Semiconductors.
Dokumenttyp:: Zeitschriftenaufsatz
Autor(en):: Dong, X.; Li, H.; Yan, Y.; Cheng, H.; Zhang, H. X.; Zhang, Y.; Le, T. D.; Wang, K.; Dong, J.; Jakobi, M.; Yetisen, A.K.; Koch, A.W.
Zeitschriftentitel:: Journal Advanced Theory and Simulations
Jahr:: 2022
Monat:: Jul
Volltext / DOI:: doi:10.1002/adts.202200140
WWW:: https://onlinelibrary.wiley.com/doi/10.1002/adts.202200140
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