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- Dokumenttyp:
- Zeitschriftenaufsatz
- Autor(en):
- Dong, X.; Li, H.; Yan, Y.; Cheng, H.; Zhang, H. X.; Zhang, Y.; Le, T. D.; Wang, K.; Dong, J.; Jakobi, M.; Yetisen, A.K.; Koch, A.W.
- Titel:
- Deep-Learning-Based Microscopic Imagery Classification, Segmentation, and Detection for the Identification of 2D Semiconductors.
- Zeitschriftentitel:
- Journal Advanced Theory and Simulations
- Jahr:
- 2022
- Monat:
- Jul
- Volltext / DOI:
- doi:10.1002/adts.202200140
- WWW:
- https://onlinelibrary.wiley.com/doi/10.1002/adts.202200140
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