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Title:

Beware of the Bias -- Statistical Performance Evaluation of Higher-Order Alphabet PUFs

Document type:
Konferenzbeitrag
Author(s):
Frisch, Christoph; Pehl, Michael
Abstract:
Physical Unclonable Functions (PUFs) derive unpredictable and device-specific responses from uncontrollable manufacturing variations. While most of the PUFs provide only one response bit per PUF cell, deriving more bits such as a symbol from a higher-order alphabet would make PUF designs more efficient. This type of PUFs is thus suggested in some applications and subject to current research. However, only few methods are available to analyze the statistical performance of such higher-order alpha...     »
Keywords:
PUF, quality evalutiation, bias, metrics
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Congress (additional information):
Antwerp, Belgium
Publisher:
IEEE
Publisher address:
Antwerp, Belgium
Year:
2022
Quarter:
1. Quartal
Year / month:
2022-03
Month:
Mar
Reviewed:
ja
Language:
en
WWW:
https://www.date-conference.com/
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