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Title:

A CMOS Temperature Stabilized 2-Dimensional Mechanical Stress Sensor with 11-bit Resolution,

Document type:
Konferenzbeitrag
Author(s):
U. Nurmetov, T. Fritz, E. Muellner, C. Dougherty, F. Kreupl , R. Brederlow
Abstract:
An integrated 11-bit 2-D CMOS stress sensor is presented with 66dB of dynamic range, measuring -100 to 360MPa, and < 1LSB error over temperature from 5ºC to 90ºC. N-Well-based primary elements enable accurate sensing of stress magnitude and angle, and allow repeatable error compensatio
Editor:
IEEE
Book / Congress title:
2019 Symposia on VLSI Technology and Circuits
Organization:
IEEE
Date of congress:
10.6.2019
Year:
2019
Covered by:
Scopus
Reviewed:
ja
Language:
en
Publication format:
WWW
Fulltext / DOI:
doi:10.23919/VLSIC.2019.8778132
TUM Institution:
Hybride Elektronische Systeme
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