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M Stelzer, M Jung, U Wurstbauer, AW Holleitner, F Kreupl
Low Temperature Sputtered Graphenic Carbon Enables Highly Reliable Contacts to Silicon
Proceedings of the 2018 IEEE International Electron Devices Meeting (IEDM)
2018
M. Stelzer, M. Jung, U. Wurstbauer, A.W. Holleitner, F. Kreupl
Low Temperature Sputtered Graphenic Carbon Enables Highly Reliable Contacts to Silicon
IEDM 2018
IEEE International Electron Devices Meeting (IEDM)
2018
Franz Kreupl
Carbon Wonderland from an Engineering Perspective
IHT-Kolloquium „Bauelemente und Technologien“
2018
Franz Kreupl
Carbon Wonderland from an Engineering Perspective
OBERSEMINAR ELEKTROPHYSIK und PHYSIKALISCHE ELEKTRONIK
2018
Elmar Mitterreiter, Eric Parzinger, Max Stelzer, Franz Kreupl, Joel Ager, Alexander Holleitner, Ursula Wurstbauer
Photocatalytic properties of MoS2 membranes
ICP2C3 - International on Physics of 2D Crystals
2018
M Hefele, W Wirths, M Brischwein, H Grothe, F Kreupl, B Wolf
Measuring fluorescence-lifetime and bio-impedance sensors for cell based assays using a network analyzer integrated circuit
Biosensors and Bioelectronics
2018
S Hommel, N Killat, T Schweinboeck, T Altes, F Kreupl
Resolving Trap-caused Charges by Scanning Microwave Microscopy
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
2018
Alfonso Furio, Max Stelzer, Moritz Jung, Franz Kreupl
Graphenic Carbon as etching mask: patterning with photolithography and KOH etching
9th Young Researcher Meeting, Salerno 2018
2018
S. Hommel, N. Killat, T. Schweinboeck, A. Altes , F. Kreupl
Resolving Trap-caused Charges by Scanning Microwave Microscopy
The International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
2018
Klein Julian, Kuc Agnieszka, Anna Nolinder, Merbeler Fabian, Altzschner Marcus, Wierzbowski Jakob, Sigger Florian, Kreupl Franz, Wurstbauer Ursula, Holleitner Alexander, Finley Jonathan J., Kaniber Michael
Generation of localised optically active defects in MoS2 using helium ion irradiation
ICPS 2018
2018
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