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Title:

Understanding the trade-offs of device, circuit and application in ReRAM-based neuromorphic computing systems

Document type:
Konferenzbeitrag
Author(s):
Yan, Bonan; Liu, Chenchen; Liu, Xiaoxiao; Chen, Yiran; Li, Hai
Book / Congress title:
2017 IEEE International Electron Devices Meeting (IEDM)
Publisher:
IEEE
Date of publication:
01.12.2017
Year:
2017
Print-ISBN:
9781538635599
Fulltext / DOI:
doi:10.1109/iedm.2017.8268371
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