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Title:

Reliability and ESD improvement of metal-semiconductor contacts by using a carbon interface laye

Document type:
Poster
Author(s):
Max Stelzer, Franz Kreupl
Congress title:
Infineon Innovation Week
Chair:
Hybride Elektronische Systeme
TUM Institution:
Hybride Elektronische Systeme
Date:
12.11.2015
Year:
2015
Language:
en
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