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- Title:
It's Getting Hot in Here: Hardware Security Implications of Thermal Crosstalk on ReRAMs
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Staudigl, Felix; Al Indari, Hazem; Schön, Daniel; Chen, Hsin-Yu; Sisejkovic, Dominik; Joseph, Jan Moritz; Rana, Vikas; Menzel, Stephan; Hagelauer, Amelie; Leupers, Rainer
- Keywords:
- Switches; Transistors; Crosstalk; Voltage; Hardware security; Resistance; Electric potential; Disturbance errors; hardware security; memristor; redox-based random access memory (ReRAM); reliability
- Journal title:
- IEEE Transactions on Reliability
- Year:
- 2024
- Pages contribution:
- 1-15
- Fulltext / DOI:
- doi:10.1109/tr.2024.3371589
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