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- Titel:
. Hyperspectral imaging microscopy for thickness measurement and surface characterization of layered MoS2
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Dong, X.; Köhler, M.H.; Jakobi, M.; Koch, A.W.
- Kongress- / Buchtitel:
- SPIE Optical Measurement Systems for Industrial Inspection XI
- Band / Teilband / Volume:
- 11056/110561S
- Jahr:
- 2019
- WWW:
- https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11056/110561S/Hyperspectral-imaging-microscopy-for-thickness-measurement-and-surface-characterization-of/10.1117/12.2530384.short?SSO=1
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