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Title:

A Reading Method for 2T2R RRAM Arrays Coding their Multiple States

Document type:
Konferenzbeitrag
Author(s):
Guo, Running; Pechmann, Stefan; Hagelauer, Amelie
Keywords:
Performance evaluation; Latches; Codes; Circuits and systems; Layout; Capacitors; Memristors; RRAM device; reading method; multi-level; 1TIR; 2T2R; Strong-Arm latch
Book / Congress title:
2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS)
Year:
2024
Pages:
157-161
Fulltext / DOI:
doi:10.1109/MWSCAS60917.2024.10658733
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