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- Title:
Analysis and Characterization of Defects in FeFETs
- Document type:
- Konferenzbeitrag
- Author(s):
- Thapar, Dhruv; Thomann, Simon; Arjun, Chaudhuri; Amrouch, Hussam; Chakrabarty, Krishnendu
- Book / Congress title:
- IEEE International Test Conference (ITC)
- Year:
- 2023
- Month:
- Oct.
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Occurrences:
- mediaTUM GesamtbestandEinrichtungenForschungszentrenMunich Institute of Robotics and Machine Intelligence (MIRMI) - The AI Mission Institute (AIM)
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)