Login
- Titel:
Analysis and Characterization of Defects in FeFETs
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Thapar, Dhruv; Thomann, Simon; Arjun, Chaudhuri; Amrouch, Hussam; Chakrabarty, Krishnendu
- Kongress- / Buchtitel:
- IEEE International Test Conference (ITC)
- Jahr:
- 2023
- Monat:
- Oct.
BibTeX
Vorkommen:
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)