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- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Dong, X.; Dong, J.; Yetisen, A.K.; Köhler, M.H.; Wang, S.; Jakobi, M.; Koch, A.W.
- Title:
- Characterization and layer thickness mapping of two-dimensional MoS2 flakes via hyperspectral line-scanning microscopy.
- Journal title:
- Applied Physics Express
- Year:
- 2019
- Journal volume:
- 12
- Fulltext / DOI:
- doi:10.7567/1882-0786/ab3e51
- Date of publication:
- 04.09.2019
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