Vmin Testing under Variations: Defect versus Fault Coverage

Titel:: Vmin Testing under Variations: Defect versus Fault Coverage
Dokumenttyp:: Konferenzbeitrag
Autor(en):: Jafarzadeh, Hanieh; Klemme, Florian; Amrouch, Hussam; Hellebrand, Sybille; Wunderlich, Hans-Joachim
Kongress- / Buchtitel:: IEEE Latin American Test Symposium (LATS'24)
Jahr:: 2024
Monat:: April
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