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- Titel:
Optimized Detection of Marginal Defects in Standard Cells Using Unsupervised Learning
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Pandaram, Karthik; Amrouch, Hussam; Polian, Ilia
- Kongress- / Buchtitel:
- IEEE The 33rd Asian Test Symposium (ATS'24)
- Jahr:
- 2024
- Monat:
- Dec
BibTeX
Vorkommen:
- mediaTUM GesamtbestandHochschulbibliographie2024Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI) - The AI Mission Institute (AIM)
- mediaTUM GesamtbestandEinrichtungenForschungszentrenMunich Institute of Robotics and Machine Intelligence (MIRMI) - The AI Mission Institute (AIM)