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- Titel:
Accelerating FeFET Reliability Analysis using Machine Learning
- Dokumenttyp:
- Zeitschriftenaufsatz
- Autor(en):
- Thomann, Simon; Novkin, Rodion; Li, Jiajie; Hu, Yuting; Xiong, Jinjun; Amrouch, Hussam
- Zeitschriftentitel:
- IEEE Transactions on Electron Devices (TED)
- Jahr:
- 2023
- Volltext / DOI:
- doi:10.1109/TED.2023.3336305
BibTeX
Vorkommen:
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)
- mediaTUM GesamtbestandEinrichtungenForschungszentrenMunich Institute of Robotics and Machine Intelligence (MIRMI) - The AI Mission Institute (AIM)