- Title:
ML to the Rescue: Reliability Estimation from Self-Heating and Aging in Transistors All the Way up Processors
- Document type:
- Konferenzbeitrag
- Author(s):
- Amrouch, Hussam; Klemme, Florian
- Book / Congress title:
- 28th Asia and South Pacific Design Automation Conference (ASP-DAC)
- Year:
- 2023
- Month:
- 01
- Pages:
- 76-82
- Fulltext / DOI:
- doi:10.1145/3566097.3568344
- BibTeX