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- Titel:
ML to the Rescue: Reliability Estimation from Self-Heating and Aging in Transistors All the Way up Processors
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Amrouch, Hussam; Klemme, Florian
- Kongress- / Buchtitel:
- 28th Asia and South Pacific Design Automation Conference (ASP-DAC)
- Jahr:
- 2023
- Monat:
- 01
- Seiten:
- 76-82
- Volltext / DOI:
- doi:10.1145/3566097.3568344
BibTeX
Vorkommen:
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)