Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction

Title:: Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction
Document type:: Zeitschriftenaufsatz
Author(s):: Kumar, Shubham; Chatterjee, Swetaki; Thomann, Simon; Chauhan, Yogesh Singh; Amrouch, Hussam
Journal title:: IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I)
Year:: 2023
Journal volume:: 70
Journal issue:: 7
Pages contribution:: 2891-2903
Fulltext / DOI:: doi:10.1109/TCSI.2023.3265427
BibTeX