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Dokumenttyp:
Zeitschriftenaufsatz
Autor(en):
Mock, J.; Kallergi, M.; Groß, E.; Golibrzuch, M.; Rieger, B.; Becherer, M.
Titel:
Revealing the Negative Capacitance Effect in Silicon Quantum Dot Light-Emitting Diodes Via Temperature-Dependent Capacitance-Voltage Characterization
Abstract:
In this study, quantum dot light-emitting diodes based on non-toxic silicon quantum dots functionalized with hexyl and dodecyl organic ligands showed a negative capacitance effect. Current density-voltage (J−V) measurements revealed the charge transport mechanisms in the QLEDs. The capacitance-voltage (C−V) characteristics were measured with an LCR meter over a wide range of frequencies (200 Hz to 1MHz) and at temperatures from −40°C to 60°C The classical heterojunction theory can describe the o...     »
Stichworte:
Silicon quantum dot (SiQD) , light-emitting diode (LED) , negative capacitance (NC)
Zeitschriftentitel:
IEEE Photonics Journal ( Early Access ) 2022-06
Jahr:
2022
Jahr / Monat:
2022-06
Quartal:
2. Quartal
Monat:
Jun
Sprache:
en
Volltext / DOI:
doi:10.1109/JPHOT.2022.3184401
WWW:
https://ieeexplore.ieee.org/abstract/document/9800704
E-ISSN:
1943-0655 CD: 1943-0647
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