Measuring Micro-Level Self-Regulated Learning Processes with Enhanced Log Data and Eye Tracking Data

Titel:: Measuring Micro-Level Self-Regulated Learning Processes with Enhanced Log Data and Eye Tracking Data
Dokumenttyp:: Konferenzbeitrag
Autor(en):: Fan, Yizhou; Lim, Lyn; Van der Graaf, Joep; Engelmann, Katharina; Molenaar, Inge; Moore, Johanna; Bannert, Maria; & Gasevic, Dragan
Kongress- / Buchtitel:: 10th International Learning Analytics & Knowledge Conference (LAK20)
Datum der Konferenz:: March 23-27, 2020
Jahr:: 2020
Sprache:: en
Hinweise:: Workshop
TUM Einrichtung:: SOT, Dep. Educational Sciences, LS f. Lehren u. Lernen m. Digitalen Medien
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