User: Guest  Login
Title:

Distance-Based Multivariate Anomaly Detection in Wire Arc Additive Manufacturing

Document type:
Konferenzbeitrag
Author(s):
Reisch, Raven; Hauser, Tobias; Lutz, Benjamin; Pantano, Matteo; Kamps, Tobias; Knoll, Alois
Pages contribution:
659-664
Keywords:
Anomaly Detection, Time Series, Multivariate, Additive Manufacturing, Machine Learning
Book / Congress title:
2020 19th IEEE International Conference on Machine Learning and Applications (ICMLA)
Publisher:
IEEE
Date of publication:
01.12.2020
Year:
2020
Print-ISBN:
9781728184708
Fulltext / DOI:
doi:10.1109/icmla51294.2020.00109
 BibTeX