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- Title:
Analysis of sub-pixel laser spot detection in laser triangulation systems
- Document type:
- Konferenzbeitrag
- Contribution type:
- Poster
- Author(s):
- Kienle, P.; Nallar, E.; Köhler, M.H.; Jakobi, M.; Koch, A.W.
- Book / Congress title:
- SPIE Optical Metrology
- Organization:
- SPIE Optical Metrology
- Date of congress:
- 24.06. bis 27.06.2019
- Year:
- 2019
- Fulltext / DOI:
- doi:10.1117/12.2525669
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