A combined Laser-scanning / Wide-field Kerr Microscope to Investigate the Switching Behavior of Nanomagnetic Logic Devices

Titel:: A combined Laser-scanning / Wide-field Kerr Microscope to Investigate the Switching Behavior of Nanomagnetic Logic Devices
Dokumenttyp:: Konferenzbeitrag
Autor(en):: Breitkreutz, S.; Kiermaier, J.; Neumeier, B.; Becherer, M.; Schmitt-Landsiedel, D.
Kongress- / Buchtitel:: Verhandl. DPG (VI) 46,1
Jahr:: 2011
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