A combined Laser-scanning / Wide-field Kerr Microscope to Investigate the Switching Behavior of Nanomagnetic Logic Devices

Title:: A combined Laser-scanning / Wide-field Kerr Microscope to Investigate the Switching Behavior of Nanomagnetic Logic Devices
Document type:: Konferenzbeitrag
Author(s):: Breitkreutz, S.; Kiermaier, J.; Neumeier, B.; Becherer, M.; Schmitt-Landsiedel, D.
Book / Congress title:: Verhandl. DPG (VI) 46,1
Year:: 2011
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