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Title:

Influence of the Domain Wall Nucleation Time on the Reliability of Perpendicular Nanomagnetic Logic

Document type:
Konferenzbeitrag
Author(s):
Breitkreutz, S.; Eichwald, I.; Žiemys, G.; Schmitt-Landsiedel, D.; Becherer, M.
Book / Congress title:
Proceedings of the 14\textsuperscriptth IEEE International Conference on Nanotechnology (IEEE-NANO)
Year:
2014
Pages:
104--107
Print-ISBN:
9781479956227
Fulltext / DOI:
doi:10.1109/nano.2014.6968096
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