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- Title:
Revealing the negative capacitance effect in silicon quantum dot light-emitting diodes via temperature-dependent capacitance-voltage characterization
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Mock, J; Kallergi, M; Groß, E; Golibrzuch, M; Rieger, B; Becherer, M
- Journal title:
- IEEE Photonics Journal
- Year:
- 2022
- Journal volume:
- 14
- Journal issue:
- 4
- Pages contribution:
- 1--9
- Fulltext / DOI:
- doi:10.1109/jphot.2022.3184401
- Publisher:
- IEEE
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