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- Title:
On the Severity of Self-Heating in FDSOI at Cryogenic Temperatures: In-depth analysis from Transistors to Full Processor
- Document type:
- Konferenzbeitrag
- Author(s):
- Kar, Anirban; Klemme, Florian; Chauhan. S, Yogesh; Amrouch, Hussam
- Book / Congress title:
- Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24)
- Year:
- 2024
BibTeX
Occurrences:
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)
- mediaTUM GesamtbestandHochschulbibliographie2024Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI) - The AI Mission Institute (AIM)