- Title:
Impact of Self-Heating in 5 nm FinFETs at Cryogenic Temperatures for Reliable Quantum Computing: Device-Circuit Interaction
- Document type:
- Konferenzbeitrag
- Author(s):
- Parihar, Shivendra; Pawha, Girish; Chauhan. S, Yogesh; Amrouch, Hussam
- Book / Congress title:
- Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24)
- Year:
- 2024
- BibTeX