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- Title:
Modeling and Investigating Total Ionizing Dose Impact on FeFET
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Sayed, Munazza; Ni, Kai; Amrouch, Hussam
- Journal title:
- IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JXCDC)
- Year:
- 2023
- Journal volume:
- PP
- Month:
- 01
- Pages contribution:
- 1-1
- Fulltext / DOI:
- doi:10.1109/JXCDC.2023.3325706
BibTeX
Occurrences:
- mediaTUM GesamtbestandHochschulbibliographie2023Integrated Research CentersMunich Institute of Robotics and Machine Intelligence (MIRMI)
- mediaTUM GesamtbestandEinrichtungenSchools TUM School of Computation, Information and TechnologyDepartmentsComputer EngineeringAI Processor Design (Prof. Amrouch)