- Titel:
On the Severity of Self-Heating in FDSOI at Cryogenic Temperatures: In-depth analysis from Transistors to Full Processor
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Kar, Anirban; Klemme, Florian; Chauhan. S, Yogesh; Amrouch, Hussam
- Kongress- / Buchtitel:
- Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24)
- Jahr:
- 2024
- BibTeX